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edastudy:tessent:atpg

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edastudy:tessent:atpg [2025/03/16 14:28] – [1.5 OCC clone] user01edastudy:tessent:atpg [2026/07/06 19:14] (当前版本) – [3. X-bounding] user01
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 ====== - atpg ====== ====== - atpg ======
 +
 +===== - LE TE概念 =====
 +  LE: Leading-Edge    -- 上升沿触发的寄存器
 +  TE: Trailing-Edge   -- 下降沿触发的寄存器
 +
 +{{:edastudy:tessent:pasted:20260630-110439.png?nolink}}
 +
 +{{:edastudy:tessent:pasted:20260630-110500.png?nolink}}
 +
  
 ===== - Transition AC ===== ===== - Transition AC =====
行 80: 行 89:
 </code> </code>
  
 +在ATPG时启用兼容时钟模式:\\
 +set_clock_restriction domain_clock -compatible_clocks_between_loads on  
 +
 +report_synchronous_clock_groups
  
 ====== - gen atpg pattern ====== ====== - gen atpg pattern ======
行 120: 行 133:
 让逻辑结合部分在shift阶段状态不变化,在capture阶段再变化。 让逻辑结合部分在shift阶段状态不变化,在capture阶段再变化。
  
 +
 +
 +====== - X-bounding ======
 +如果报
 +<code>
 +// Warning: Could not identify the data path input for the library cell containing
 +// the memory element at /dff115/D (382.4). X-bounding logic cannot be inserted in
 +// the scan path so this is a fatal error. This could be caused by missing
 +// pin constraints and/or scan_enable connections. (XB2-1)
 +</code>
 +一个解法是给对应的register cell换成带scan cell的,要么把它的SE悬空,要么把它case为1,即能在它前面正常插入x-bounding.
edastudy/tessent/atpg.1742106483.txt.gz · 最后更改: 2025/03/16 14:28 由 user01

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